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#1

Run-to-Run Control in Semiconductor Manufacturing

James Moyne, Enrique del Castillo, Arnon M. Hurwitz

8.79 Mb

#2

Process Optimization: A Statistical Approach

Enrique del Castillo

12.42 Mb

#3

Process Optimization: A Statistical Approach

Enrique del Castillo

13.34 Mb

#4

Run-to-run control in semiconductor manufacturing

James Moyne, Enrique del Castillo, Arnon M. Hurwitz

Категория: 'Semiconductors -- Design and construction.', 'Semiconductor industry -- Production control.', 'Electronic packaging.', 'Production management.', 'Productiecontrole.', 'Productiemanagement.', 'Procesbeheersing.'

9.13 Mb

#5

Bayesian Process Monitoring, Control and Optimization

Bianca M. Colosimo, Enrique del Castillo

Категория: engeneering_technology

3.69 Mb